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RF performance inspection for LF & HF Smart Card, RFID Inlay/tag, NFC & Inductor

T8200PRO-G is a top RFID comprehensive tester from Testram Japan. It’s a good choice for RFID, Smart card (contactless and dual interface), the development and manufacturing of power inductors, scientific research and education, laboratories or testing institutions and easily integrate into an automated production line.

Test Principle

Test Principle

Testing Principle Contactless resonance frequency with magnetic coupling
Measuring Mode Transmission/reflection characteristics
Testing Items Resonance frequency, Attenuation, Q Value, UID, Chip type (part)
Protocol ISO14443A (MIFARE Classic, MIFARE Ultralight)ISO14443B (Only PUPI), Felica

ISO15693 (Tag-it HF-I Plus/Pro, ICODE SLIX2)

Data Points 100~2048 points
Test Time (data points=1000) Without ID reading: 0.5 sec (typ)With ID reading: 1 sec (typ)
Log File Log file (csv):UID, PASS/FAIL, Resonance Frequency, Attenuation, Q Value

Waveform format: csv, jpg

Frequency Range 10KHz~100MHz
Application Power (50Ω load) -30~15dBm
DIO Interface (optional) Isolated input/output
System Requirements PC(OS) Windows7, Windows8.1, Windows10≥USB2.0
Power Supply USB bus power (current consumption≤500mA)
Packaging List Main unit, USB cable, Coaxial cable(500m x2), High frequency standard card size test fixture, Optional different size specifications for testing antenna plates, Install CD
Dimension Weight 125(W)x165(D)x40(H)mm, Protrusion not included, 0.8kg

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